Viavi FVAi-2030 Digital Inspection Scope
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TRANSCRIPT:
This is the latest addition to our VF lines specifically designed for contamination control throughout the connector manufacturing process. For years connectivity manufacturers have been customers of Viavi and our wide range of microscopes and they’re used throughout the manufacturing process. Maintaining clean connectors has always been a challenge. One could pass at one stage in your manufacturing process and then fail at the next confused as to where that contamination would be coming from, despite the use of high-resolution microscopes, customers discovered that they needed a new way to visualize the end face. And bringing in a wide field of view was one of the challenges that they wanted to see improved. The FVAi-2030 addresses this by letting operators see what other microscopes cannot contamination anywhere on the fiber, and the surrounding champion. There are three key elements to the 2030 that make this possible, an ultra-wide field of view, our patented shaped lighting technology, and last but certainly not least, automated analysis to assist in the identification of defects on the surface.
First on our list is ultra-wide field of view optics operators using the 2030 we can now see the entire ferrule and surrounding chamfer. With a field of view of greater than 3700 microns, which can easily be toggleable between ferrule and chamfer. Operators have an unprecedented view and ability to visualize the entire federal surface. Next on our list our patented shape lighting technology, which optimizes image lighting and contrast, so contamination is easily visible. It enables the use of coaxial illumination in a wide field of view application, so the defects can be easily identified across the entire end face. This is the first commercial product which is allowed using our shaped lighting technology to bring coaxial illumination to the table. We’ve added several new shape lighting adapters to our family at F max adapters we have you covered across the entire ecosystem of connectors whether they are new VSFF, or standard 2.5 or 1.25 ferrules.
And finally, automated analysis, which provides objective, detection, support and visual assist to identify defects, documentation of results and advanced data for analytics. Beyond just simple particle size, can include advanced parameters like total occluded area, particle geographical distributions, and other advanced ways to decide or determine cleanliness. The customer benefits and applications are clear, the ability to remove contamination early at the source improves production yields across the manufacturing process. It will eliminate costly component waste and optimizes performance results across the manufacturing line.
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